MindMap Gallery Deep hole inner diameter measurement system based on non-contact capacitive sensor
Mechanical testing technology, measurement of deep hole straightness, SCI English literature translation, saving time.
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Deep hole inner diameter measurement system based on non-contact capacitive sensor
Summary
A precision deep hole and small aperture measurement system with capacitive sensors is proposed. Based on the working principle of the non-contact capacitive sensor, the influence of the edge effect of the gauge head is studied, and a capacitive sensor for measuring the aperture of small blind holes or through holes is proposed. The system consists of a positioning device, a capacitive sensor for aperture measurement, a measurement circuit and software. The system uses visual CCD and two-dimensional fine-tuning mechanism to achieve precise positioning. Through LabView software, you can control this system to run automatically, perform calibration and automatic data collection, and import data directly into the database. Experiments have proven that the system has a diameter measurement range of 1.8 mm–7 mm, a resolution of 5 nm–10 nm, a repeatability measurement standard deviation of 0.05 µm–0.1 µm, and a measurement uncertainty of 0.15 micron–0.3 micron. Therefore, the measurement system can achieve nanoscale measurements.
1. Capacitive sensor
1.1 Principle of capacitive sensor
Capacitance (C) is determined by the overlapping area of the plates (S), the plate separation distance (d) and the dielectric constant (ε) of the material between the plates. In a typical system, the capacitive probe acts as one on the board and the target under test acts as the other. The dielectric properties of the material within the gap typically remain constant with the area of the probe; therefore, the only variable causing a change in capacitance is the probe-to-target distance [2]. Using the following method, the system converts this changing capacitance into a linear voltage proportional to the probe gap.
capacitive sensor
1.2 System linearization
The amplitude modulation amplification system is introduced into the aperture measurement of small deep holes, and the open-loop gain of the measurement circuit is greater than 95 db. Formula 1 where Cs is the standard capacitance (F); Us US fixed amplitude power supply (V), the voltage offset must be less than 0.01 %; U is the amplification system output voltage (V); d is the distance between the electrode and the workpiece (m); S is the overlapping area of the electrodes (m2); ε dielectric constant; k proportionality coefficient, and (2). Therefore, in equation (1), the system converts this changing capacitance into a linear voltage proportional to the probe gap (d)
1.3 Eliminate the influence of gauge edge effects
To maintain a highly linear response, it is important to establish a uniform electric field in the gap. In order to achieve this goal, this paper adopts the "protection" detection method. By design, the probe ring is completely surrounded by a guard ring that is precisely driven at the same potential and phase as the probe's sensing area. This not only eliminates any external effects of noise, but also reduces the "streaking" of the magnetic field on the target being measured. In this way a linearity exceeding 0.1% of the full-scale measurement range can be obtained. The structure of the gauge head is shown in Figure 2.
Gauge head structure
1.4 Aperture measurement capacitive sensor
1.4.1 Principle of non-contact capacitive sensor for aperture measurement
When the cylindrical measuring electrode is located in the center of the hole, the capacitance between the meter head and the metal hole can be calculated by formula (3): where C is the capacitance between the electrode and the hole (F); the electrode height Lm (m) ; R radius of the measuring hole (m); r radius of the electrode (m) If d represents the distance between the electrode and the hole wall, then under the premise that the gap d is equal to 0.1r, the relative measurement error is only 5×10-3 , and then convert equation (1) to (4), in equation (4), the relationship between the output voltage U and the distance d is linear. If U is measured, the diameter of the measuring hole is twice the sum of r and h.
1.4.2 Eccentricity
Equation (3) is based on the concentricity of the gauge head and hole as mentioned above. If eccentricity is present, convert the capacitance measurement equation (3) to (5), where e is the eccentricity (m)
It can be seen from equation (5) that the capacitance between the electrode and the hole has an inverse hyperbolic cosine relationship with the square of the eccentricity, as shown in Figure 3. Graph of capacitance versus eccentricity. It can be seen from Figure 3 that when the capacitance is minimum, since the electrode is annular, the meter head is exactly in the center of the hole, because the decrease in capacitance offsets the increase in capacitance caused by the eccentricity of one side of the electrode. on the other side. Experiments have proven that a one micron displacement of the meter head can bring about a 100 mV change in the output voltage. When the voltage does not change by more than 10 mV, consider the meter tip as the center of the hole. At this point, the capacitance can be used to calculate the pore size of the metal hole.
1.4.3 Principle of drive cable
Guard rings are used to eliminate the effects of edge effects on the gauge head. The principle of the guard ring is shown in Figure 4. The first part is the measuring probe, the second part is the protective cover ring, the 3rd part is the insulation layer, the 4th part is the outer protective layer (ground). V1 is the voltage between ground and the measuring head, V2 is the voltage between the internal insulation layer and ground. Ring guard schematic diagram
Representing the total capacitance of the Cg measuring head, the C12 capacitance between the guard ring and the measuring probe, and the Cr capacitance between the measuring probe and the workpiece, the stray capacitance C12 can be calculated by the following formula: When V1 is equal to V2, the protection caused by Stray capacitance C12 generated by the ring.
Drive cables are used to reduce the effects of stray capacitance and external interference. Incomplete drive cable technology is used to reduce the cost and complexity of the circuit. The principle is shown in Figure 5. The measuring probe is connected to the Σ point of the amplifier through the core wire of the cable, and the inner shielding layer of the cable is connected to the protective ring. The hole in the workpiece (the other electrode, connected to the sensor's housing) is connected to the ground to avoid external interference. Assuming Vcab is the voltage between the inner shield and ground, the VCT voltage between the core wire and ground ground and an amplification parameter, then
The stray capacitance ΔC generated by the guard ring is (10) Assuming C12 = 200 pF, A = 50 000, then ΔC = 0.004 pF. If parameter A is large enough, the effect of stray capacitance is small. In this way we can achieve very high measurement accuracy.
2Capacitive non-contact measurement system
2.1 Structure of the measurement system
As shown in Figure 6, the system consists of a stepper motor, a two-dimensional positioning device, a CCD camera, a probe, a rectifier filter circuit, a data acquisition card, an image acquisition card and a motor drive card. The two-dimensional size positioning device, clamp, stepper motor and CCD camera are fixed on the workbench. Clamps are used to secure ring gauges, sensors and workpieces. The two-dimensional positioning device is used to adjust the X and Y position of the sensor. The stepper motor is used to adjust the vertical position of the workpiece so that the aperture is at different depths measured by the sensor. A CCD camera is used to photograph the tops of the cylindrical fixed head and sensor head to produce a magnified image, thus initially aligning their centers. Processing circuitry is used to eliminate stray capacitance noise and convert the different diameter values into a linear digital output voltage that is displayed on the front panel and transmitted to the computer. The computer software performs data processing and data storage.
Structure of the measuring system
2.2 Determination and measurement of coefficients
The system can use four different specifications of capacitive sensors to measure the aperture value ranges of four series: Ф2.4mm, Ф2.92mm, Ф3.5mm, and Ф7mm. Each series of sensors is calibrated using four standard rings with different known diameter values. By measuring the voltage values of four different diameters, linear fitting is performed to obtain the slope k and intercept b of the linear function. Therefore, the relationship between voltage and aperture is y = kx b, where x is the voltage and y is the aperture. Then by measuring the output voltage, the pore diameter of the workpiece can be calculated accordingly. The system is controlled by LabView software. The system can automatically perform measurements
2.3 Simulation experiment
This experiment takes the Φ3.5mm series in the system as an example. The capacitive aperture measurement sensor and Φ3.5mm series standard ring are shown in Figure 7. In the calibration experiment, the diameter of the standard ring is approximately 3.5 mm. The results are shown in Table 1. We then measured these standard ring gauges again using the above calibration results in Table 1 to obtain the indicated error of the standard ring gauge. The results are shown in Table 2.
Table 1 Calibration experimental data of Φ3.5mm series sensors
sensor probe
Standard ring gauge
Tab.2 indicates the error measurement of the standard ring gauge
As can be seen from Table 2, the indicated error for this family of systems ranges from 0.002 µm to 0.076 µm, with an average of 0.039 µm. Since the calibration error is caused by the error in the nominal value of the standard ring gauge, the calibration error makes it impossible to further enhance the effect of the system indicating the error. In order to obtain the repeatability measurement standard deviation and measurement uncertainty of the standard ring gauge, we conducted ten measurements on the standard ring gauge with a nominal value of Φ3.5101 mm. The results are shown in Table 3.
Table 3 Repeatability measurement of standard ring gauge Φ3.5101 mm
In Tab.3 we can see that the repeatability metric standard deviation is 0.082 µm and the measurement uncertainty is 0.246 µm. In the workpiece measurement experiment, a workpiece with a diameter of about 3.5mm and a length of about 50mm is taken as an example. The above coefficient calibration results are used for the measurement system. The results are shown in Table 4.
Tab.4 Measurement results of workpiece
As can be seen from the data in Table 4, the measurement result of the inner diameter of the workpiece is Φ3499.47 µm, the maximum value is Φ3499.68 µm, the minimum value is Φ3499.32 µm, and the processing tolerance is 0.36 µm. The system's diameter measurements and machining tolerances are consistent with previous measurements.
3Conclusion
The proposed system can accurately measure the hole diameter of small deep holes, which is a thorny problem with low accuracy. Capacitive sensors were originally introduced for the measurement of small deep hole apertures. With current micromachining technology, gauge heads can be made very small and can measure the diameter of holes of a few millimeters. Experiments have proven that the diameter measurement range of the entire system can be from Φ1.8mm to Φ7mm, the resolution can reach 5 nm-10 nm, and the repeatability measurement standard deviation can be measured in the range of 0.05 µm-0.1µm. Uncertainties can reach 0.15 µm to 0.3 µm. Therefore, this contactless system is portable, automatic, and has high measurement accuracy and provides fast response.