MindMap Gallery Experimental Techniques of Atomic Force Microscopy (AFM)

Experimental Techniques of Atomic Force Microscopy (AFM)

Atomic force microscopy (AFM) is a high-resolution imaging technique based on the interaction between a probe and the sample surface. Prior to performing AFM experiments, careful sample preparation is required to ensure imaging quality. By interpreting AFM images, the surface morphology, roughness, and other physical properties of the sample can be analyzed. These data are crucial for understanding the microstructure and performance of materials.

Edited at 2024-12-23 08:53:54
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Experimental Techniques of Atomic Force Microscopy (AFM)

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